Abstract:[Objective] Here, we explore the effect of the low concentration tetracycline (TC) and Benzo [a] pyrene (Bap) on the generation of high resistance gene tetA(C) mutations in the environment.[Methods] Escherichia coli, pACYC184 plasmid and tetracycline resistance gene tetA(C) was used as the host strain, the vector and the research object, respectively. Error-prone PCR was used to construct the gene library, the code table of high resistance mutation sites was established corresponding to high resistance mutants in the gene library. At the same time, the E. coli carrying pACYC184 were cultivated with 0-10 mg/L TC and 0-30 mg/L Bap 14 d. We randomly selected ten high resistance mutation from each group. The tetA(C) genes in these mutations were then sequenced. Sequencing results were compared with the code table of high resistance mutation sites, calculated the proportion of high resistance mutants caused by tetA(C) gene mutation in all high resistant strains.[Results] Sequencing results showed that under the selection pressure of low concentration TC, while the Bap concentration increases, the frequency of high resistance gene mutant increases (P ≤ 0.01). But without TC, there is no corelation between Bap concentration and the frequency of high resistance gene mutants (P>0.05).[Conclusion] When Bap and low concentration TC both in the environment, the high resistance mutants were easier survived by selection pressure.